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First 1241 results for ” Maria João Costa”

  1. Genome-wide gene-environment interaction study uncovers 162 vitamin D status variants using a precise ambient UVB measure

    Vitamin D status is influenced by genetic and environmental factors-primarily sun exposure. Using...

    Shraim, R., Timofeeva, M., Wyse, C., van Geffen, J., van Weele, M., Romero-Ortuno, R. Lopez, L.M., Kleber, M.E., Pilz, S., März, W., Fletcher, B.S., Wilson, J.F., Theodoratou, E., Dunlop, M.G., McManus, R. and Zgaga, L. | Journal: Nature Communications | Volume: 16 | Year: 2025 | First page: 10774 | doi: 10.1038/s41467-025-65820-x

    Publication

  2. Investigating African trace gas sources, vertical transport, and oxidation using IAGOS-CARIBIC measurements between Germany and South Africa between 2009 and 2011

    Between March 2009 and March 2011 a commercial airliner equipped with a custom built measurement ...

    UR Thorenz, AK Baker, EC Leedham Elvidge, C Sauvage, H Riede, PFJ van Velthoven, M Hermann, DE Oram, CAM Brenninkmeijer, A Zahn, J Williams | Status: published | Journal: Atmos. Environm. | Year: 2017 | First page: 11 | Last page: 26 | doi: 10.1016/j.atmosenv.2017.03.021

    Publication

  3. Changes in the frequency and intensity of extremes over Northeast Africa

    Climate of Northeastern Africa varies from humid to semi-arid with both abundant and scarce mois...

    G Endalew | Year: 2007 | Pages: 46

    Publication

  4. Continuous mixing layer height determination using the LD-40 ceilometer: a feasibility study

    Climate of Northeastern Africa varies from humid to semi-arid with both abundant and scarce moist...

    MJ de Haij, WMF Wauben, H Klein Baltink | Year: 2007 | Pages: 45

    Publication

  5. HIGH-RESOLUTION ASCAT SCATTEROMETER WINDS NEAR THE COAST

    KNMI is involved in the Level 2 scatterometer wind processing of the EUMETSAT Ocean and Sea Ice S...

    A Stoffelen, M Portabella, A Verhoef, J Verspeek, J Vogelzang | Conference: International Geoscience and Remote Sensing Symposium (IGARSS) | Organisation: IEEE | Place: Boston, USA | Year: 2008 | First page: 0 | Last page: 0

    Publication