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First 89 results for ” VH Peuch”

  1. The global atmospheric environment for the next generation

    Air quality, ecosystem exposure to nitrogen deposition, and climate change are intimately coupled...

    F Dentener, D Stevenson, K Ellingsen, T van Noije, M Schultz, M Amann, C Atherton, N Bell, D Bergmann, I Bey, L Bouwman, T Butler, J Cofala, B Collins, J Drevet, R Doherty, B Eickhout, H Eskes, A Fiore, M Gauss, D Hauglustaine, L Horowitz, ISA Isaksen, B Josse, M Lawrence, M Krol, JF Lamarque, V Montanaro, JF Müller, VH Peuch, G Pitari, J Pyle, S Rast, J Rodriguez, M Sanderson, NH Savage, D Shindell, S Strahan, S Szopa, K Sudo, R Van Dingenen, O Wild, G Zeng | Status: published | Journal: Environ. Sci. Technol. | Volume: 40 | Year: 2006 | First page: 3586 | Last page: 3594 | doi: 10.1021/es0523845

    Publication

  2. Quality information for radars and radar data

    The workplan of the second phase of the EUMETNET OPERA program (2004-2006) contains a work packag...

    I Holleman, D Michelson, G Galli, U Germann, M Peura | Year: 2005

    Publication

  3. Quality information for radars and radar data

    The workplan of the second phase of the EUMETNET OPERA program (2004-2006) contains a work packag...

    I Holleman, D Michelson, G Galli, U Germann, M Peura | Year: 2005

    Publication

  4. Long-range atmospheric infrasound propagation from subsurface sources

    In seismology and ocean acoustics, the interface with the atmosphere is typically represented as ...

    G Averbuch, JD Assink, LG Evers | Status: published | Journal: J.A.S.A. | Volume: 147 | Year: 2020 | First page: 1264 | Last page: 1274 | doi: 10.1121/10.0000792

    Publication

  5. Statistical Quality Control of High-Resolution Winds of Different Radiosonde Types for Climatology Analysis

    Quality control (QC) is among the most important steps in any data processing. These steps are el...

    K Houchi, A Stoffelen, GJ Marseille, J de Kloe | Status: published | Journal: J. Atm. Oceanic Technol. | Volume: 32 | Year: 2015 | First page: 1796 | Last page: 1812 | doi: DOI: 10.1175/JTECH-D-14-00160.1

    Publication