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A protocol for probabilistic extreme event attribution analyses
Over the last few years, methods have been developed to answer questions on the effect of global ...
SY Philip, SF Kew, GJ van Oldenborgh, FEL Otto, R Vautard, K van der Wiel, A King, F Lott, J Arrighi, R Singh, M van Aalst | Status: published | Journal: Adv. Stat. Clim. Meteorol. Oceanogr. | Volume: 6 | Year: 2020 | First page: 177 | Last page: 203 | doi: https://doi.org/10.5194/ascmo-6-177-2020
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A new TROPOMI product for tropospheric NO2 columns over East Asia with explicit aerosol corrections
We present a new product with explicit aerosol corrections, POMINO-TROPOMI, for tropospheric nitr...
M Liu, J Lin, H Kong, F K Boersma, H J Eskes, Y Kanaya, Q He, X Tian, K Qin, P Xie, R Spurr, R Ni, Y Yan, H Weng, J Wang | Status: accepted | Journal: Atmos. Meas. Tech. | Volume: 13 | Year: 2020 | First page: 4247 | Last page: 4259 | doi: 10.5194/amt-13-4247-2020
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Quantification of nitrogen oxides emissions from build-up of pollution over Paris with TROPOMI
Nitrogen dioxide (NO2) is a regulated air pollutant that is of particular concern in many cities,...
Lorente, A., Boersma, K. F., Eskes, H. J., Veefkind, J. P., van Geffen, J. H. G. M., de Zeeuw, M. B., Denier van der Gon, H. A. C., Beirle, S., and Krol, M. C | Journal: Scientific Reports | Year: 2019 | doi: https://doi.org/10.1038/s41598-019-56428-5
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On the development of a scatterometer-based correction for NWP wind forcing systematic errors: Impact of satellite sampling
Local systematic differences between scatterometer and global numerical weather prediction (NWP) ...
Ana Trindade, Marcos Portabella, Wenming Lin, Ad Stoffelen
| Journal: IEEE International Geoscience and Remote Sensing Symposium (IGARSS) | Year: 2017 | doi: https://doi.org/10.1109/IGARSS.2017.8127414
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Improved Low visibility and Ceiling Forecasts at Schiphol Airport
Airport capacity reduces due to low visibility, resulting in delays, diversions and cancellations...
J. Wijngaard, D. Vogelezang, H. van Bruggen, N. Maat, CJ de Rover (KLM), L. Smit (LVNL), J. Heijstek (NLR), M. Keet (Schiphol Group), R. ten Hove (Schiphol Group) | Year: 2008 | Pages: 38
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