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First 130 results for ” S Naeem”

1. The effect of differences between rainfall measurement techniques on groundwater and discharge simulations in a lowland catchment

   Several rainfall measurement techniques are available for hydrological applications, each with it...

   CC Brauer, A Overeem, H Leijnse, R Uijlenhoet | Status: published | Journal: Hydrol. Proc. | Volume: 30 | Year: 2016 | First page: 3885 | Last page: 3900 | doi: 10.1002/hyp.10898

   Publication

2. The potential of urban rainfall monitoring with crowdsourced automatic weather stations in Amsterdam

   The high density of built-up areas and resulting imperviousness of the land surface makes urban a...

   LW de Vos, H Leijnse, A Overeem, R Uijlenhoet | Status: published | Journal: Hydrology and Earth System Sciences | Year: 2017 | First page: 765 | Last page: 777 | doi: 10.5194/hess-21-765-2017

   Publication

3. Extreme regenval en overstromingen in het stroomgebied van de Hupselse Beek

   Op 26 en 27 augustus 2010 werd het stroomgebied van de Hupselse Beek getroffen door extreme neers...

   C Brauer, R Teuling, A Overeem, R Uijlenhoet | Journal: H2O | Volume: 44 | Year: 2011 | First page: 23 | Last page: 26

   Publication

4. Quality Control for Crowdsourced Personal Weather Stations to Enable Operational Rainfall Monitoring

   Automatic personal weather stations owned and maintained by weather enthusiasts provide spatially...

   LW de Vos, H Leijnse, A Overeem, R Uijlenhoet | Status: published | Journal: Geophys. Res. Lett. | Volume: 46 | Year: 2019 | First page: 1 | Last page: 10 | doi: 10.1029/2019GL083731

   Publication

5. Rainfall Estimation Accuracy of a Nationwide Instantaneously Sampling Commercial Microwave Link Network: Error Dependency on Known Characteristics

   Commercial microwave links are installed and maintained for the purpose of telecommunication. Hyd...

   LW de Vos, A Overeem, H Leijnse, R Uijlenhoet | Status: published | Journal: J. Atm. Oceanic Technol. | Volume: 36 | Year: 2019 | First page: 1267 | Last page: 1283 | doi: 10.1175/JTECH-D-18-0197.1

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