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First 304 results for ”DR Weimer”

1. Assessment and tuning of data assimilation systems using passive observations

   Independent observations can be used to diagnose and tune a data assimilation (DA) system. Analys...

   GJ Marseille, J Barkmeijer, S de Haan, W Verkley | Status: published | Journal: Quart. J. Royal Meteor. Soc. | Volume: 142 | Year: 2016 | First page: 3001 | Last page: 3014 | doi: 10.1002/qj.2882

   Publication

2. On mesoscale analysis and ASCAT ambiguity removal

   The two-dimensional variational ambiguity removal (2DVAR) method provides a spatial analysis of t...

   W Lin, M Portabella, A Stoffelen, J Vogelzang, A Verhoef | Status: published | Journal: Quart. J. Royal Meteor. Soc. | Volume: 142 | Year: 2016 | First page: 1745 | Last page: 1756 | doi: 10.1002/qj.2770

   Publication

3. High resolution scatterometer wind processing

   The launch of the Advanced Scatterometer ASCAT on MetOp-A is planned on 17 July 2006. Development...

   J Vogelzang, A Stoffelen, M Portabella, A Verhoef, J Verspeek | Conference: EUMETSAT Meteorological Satellite Conference | Organisation: EUMETSAT | Place: Helsinki, Finland | Year: 2006 | First page: 0 | Last page: 0

   Publication

4. Projected changes in extreme precipitation in Africa under global warming. Part 1: Southern Africa

   This study investigates likely changes in mean and extreme precipitation in southern Africa in re...

   ME Shongwe, GJ van Oldenborgh, BJJM van den Hurk, B de Boer, CAS Coelho, MK van Aalst | Status: published | Journal: J. Climate | Volume: 22 | Year: 2009 | First page: 3819 | Last page: 3837 | doi: 10.1175/2009JCLI2317.1

   Publication

5. Full-year evaluation of nonmeteorological echo removal with dual-polarization fuzzy logic for two C-band radars in a temperate climate

   The Royal Netherlands Meteorological Institute (KNMI) operates two dual-polarization C-band weath...

   A Overeem, R Uijlenhoet, H Leijnse | Status: published | Journal: J. Atm. Oceanic Technol. | Volume: 37 | Year: 2020 | First page: 1643 | Last page: 1660 | doi: 10.1175/JTECH-D-19-0149.1

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