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First 431 results for ” A Heikkilä”

  1. The TROPOMI surface UV algorithm

    The TROPOspheric Monitoring Instrument (TROPOMI) is the only payload of the Sentinel-5 Precursor ...

    AV Lindfors, J Kujanpää, N Kalakoski, A Heikkilä, K Lakkala, T Mielonen, M Sneep, NA Krotkov, A Arola, J Tamminen1 | Status: published | Journal: Atmospheric Measurement Techniques | Volume: 11 | Year: 2018 | First page: 997 | Last page: 1008 | doi: 10.5194/amt-11-997-2018

    Publication

  2. Comparison of ambient aerosol extinction coefficients obtained from in-situ, MAX-DOAS and LIDAR measurements at Cabauw

    P Zieger, E Weingartner, J Henzing, M Moerman, G de Leeuw, J Mikkilä, M Ehn, T Petäjä, K Clémer, M van Roozendaal, S Yilmaz, U Frieß, H Irie, A Apituley, KM Wilson | Status: published | Journal: Atm. Chem. Phys. | Year: 2011 | doi: doi:10.5194/acp-11-2603-2011

    Publication

  3. Comparison of particle number size distribution trends in ground measurements and climate models

    Despite a large number of studies, out of all drivers of radiative forcing, the effect of aerosol...

    V Leinonen, H Kokkola, T Yli-Juuti, T Mielonen, T. Kühn, T Nieminen, S Heikkinen, T Miinalainen, T Bergman, K Carslaw, S Decesari, M Fiebig, T Hussein, N Kivekäs, R Krejci, M Kulmala, A Leskinen, A Massling, N Mihalopoulos, JP Mulcahy, SM Noe, T van Noije, FM O'Connor, C O'Dowd, D Olivie, JB Pernov, T Petäjä, Ø Seland, M Schulz, CE Scott, H Skov, E Swietlicki, T Tuch, A Wiedensohler, A Virtanen, S Mikkonen | Journal: Geosci. Mod. Dev. | Volume: 22 | Year: 2022 | First page: 12873 | Last page: 12905 | doi: 10.5194/acp-22-12873-2022

    Publication

  4. Science Goals of EOS-Aura\'s Ozone Monitoring Instrument (OMI)

    PF Levelt, GHJ van den Oord, R Noordhoek, E Hilsenrath, PK Bhartia, GW Leppelmeier, A Mälkki | Conference: XX Quadrennial Ozone Symposium | Organisation: University of Athens | Place: Athens | Year: 2004 | First page: 393 | Last page: 394

    Publication

  5. Ozone Monitoring with the OMI Instrument

    E Laan, J de Vries, H Visser, PF Levelt, GHJ van den Oord, A Mälkki, G Leppelmeier, E Hilsenrath | Conference: SPIE 45th Annual Meeting - The International Symposium on Optical Science and Technology | Place: San Diego | Year: 2000 | First page: 334 | Last page: 343

    Publication