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First 592 results for ” Nowlan”

1. Past changes in the vertical distribution of ozone – Part 1: Measurement techniques, uncertainties and availability

   Peak stratospheric chlorofluorocarbon (CFC) and other ozone depleting substance (ODS) concentrati...

   B Hassler, I Petropavlovskikh, J Staehelin, PF Levelt, RJ van der A, JP Veeflind, et al. | Status: published | Journal: Atmospheric Measurement Techniques | Year: 2014 | First page: 1395 | Last page: 1427 | doi: 10.5194/amt-7-1395-2014

   Publication

2. Cloud Initialization in the Rapid Update Cycle of HIRLAM

   The Nowcasting Satellite Application Facility (NWC SAF) cloud mask from the Meteosat Second Gener...

   S de Haan, SH van der Veen | Status: published | Journal: Weather and Forecasting | Volume: 29 | Year: 2014 | First page: 1120 | Last page: 1133 | doi: 10.1175/WAF-D-13-00071.1

   Publication

3. 3D Exploration of Weather Data in Combination with IASI L2 Products for Better Understanding of Potential Applications

   At the Royal Netherlands Meteorological Institute (KNMI) the Weather3DeXplorer (W3DX) is develope...

   M Koutek, S de Haan, I van der Neut, F Debie, P de Valk, S Tjemkes | Conference: EUMETSAT Meteorological Satellite Conference | Year: 2014 | First page: 0 | Last page: 0

   Publication

4. Anthropogenic emissions of NOx over China: Reconciling the difference of inverse modeling results using GOME-2 and OMI measurement

   Inverse modeling using satellite observations of nitrogen dioxide (NO2) columns has been extensiv...

   D Gu, Y Wang, C Smeltzer, KF Boersma | Status: published | Journal: J. Geophys. Res. | Volume: 119 | Year: 2015 | doi: doi:10.1002/2014JD021644

   Publication

5. Statistical Quality Control of High-Resolution Winds of Different Radiosonde Types for Climatology Analysis

   Quality control (QC) is among the most important steps in any data processing. These steps are el...

   K Houchi, A Stoffelen, GJ Marseille, J de Kloe | Status: published | Journal: J. Atm. Oceanic Technol. | Volume: 32 | Year: 2015 | First page: 1796 | Last page: 1812 | doi: DOI: 10.1175/JTECH-D-14-00160.1

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