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First 1001 results for ” H Von Storch”

  1. ERS Scatterometer Product User Manual version 1.6

    Product User Manual of the EUMETSAT Advanced Retransmission Service (EARS) ERS wind product.

    KNMI EARS Team, A Verhoef, A Stoffelen | Year: 2008

    Publication

  2. Implementation of scatterometer wind processing at KNMI - final report

    Scatterometers provide accurate and spatially consistent near-surface wind information. Hardware...

    Ad Stoffelen, Tilly Driesenaar, Jeroen Beysens | Year: 2003

    Publication

  3. Validation of the TROPOMI/S5P aerosol layer height using EARLINET lidars

    The purpose of this study is to investigate the ability of the Sentinel-5P TROPOspheric Monitorin...

    Konstantinos Michailidis, Maria-Elissavet Koukouli, Dimitris Balis, J. Pepijn Veefkind, Martin de Graaf, Lucia Mona, Nikolaos Papagianopoulos, Gesolmina Pappalardo, Ioanna Tsikoudi, Vassilis Amiridis, Eleni Marinou, Anna Gialitaki, Rodanthi-Elisavet Mamouri, Argyro Nisantzi, Daniele Bortoli, Maria João Costa, Vanda Salgueiro, Alexandros Papayannis, Maria Mylonaki, Lucas Alados-Arboledas, Salvatore Romano, Maria Rita Perrone, and Holger Baars | Journal: ACP | Volume: 23 | Year: 2023 | First page: 1919 | Last page: 1940 | doi: 10.5194/acp-23-1919-2023

    Publication

  4. Geophysical validation of Sciamachy NO2 vertical columns: Overview of early 2004 results

    JC Lambert, T Blumenstock, KF Boersma, A Bracher, M De Mazière, P Demoulin, I De Smedt, H Eskes, M Gil, F Goutail, J Granville, F Hendrick, DV Ionov, PV Johnston, .............................. | Conference: Second workshop on the Atmospheric Chemistry Validation of Envisat (ACVE-2) SP-562 | Organisation: ESRIN | Place: Frascati | Year: 2004 | First page: 0 | Last page: 0

    Publication

  5. Validation of Backscatter Measurements from the Advanced Scatterometer on MetOp-A

    C Anderson, J Figa, H Bonekamp, J Wilson, J Verspeek, A Stoffelen, M Portabella | Status: published | Journal: J. Atm. Oceanic Technol. | Volume: 29 | Year: 2012 | First page: 77 | Last page: 88 | doi: 10.1175/JTECH-D-11-00020.1

    Publication