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First 508 results for ” Hugo Stieglitz”

  1. Ozone profile retrieval from nadir TROPOMI measurements in the UV range

    The TOPAS (Tikhonov regularised Ozone Profile retrievAl with SCIATRAN) algorithm to retrieve vert...

    Mettig, N.; Weber, M.; Rozanov, A.; Arosio, C.; Burrows, J. P.; Veefkind, P.; Thompson, A. M.; Querel, R.; Leblanc, T.; Godin-Beekmann, S.; Kivi, R.; Tully, M. B. | Journal: Atmospheric Measurement Techniques | Year: 2021 | doi: https://doi.org/10.5194/amt-14-6057-2021

    Publication

  2. Evaluation of SCIAMACHY Level-1 data versions using nadir ozone profile retrievals in the period 2003–2011,

    Ozone profile retrieval from nadir-viewing satellite instruments operating in the ultraviolet–vis...

    S. Shah O.N.E. Tuinder J. van Peet P. Stammes A.T.J. de Laat | Journal: Atmospheric Measurement Techniques | Volume: 11 | Year: 2018 | First page: 2345 | Last page: 2360 | doi: 10.5194/amt-11-2345-2018

    Publication

  3. Long-term changes in CH4 emissions: Comparing ΔCH4/ΔCO2 ratios between observation and proved model in East Asia (2010–2020)

    To understand the changes in CH4 emissions in East Asia, mainly in China, we analyzed the synopti...

    Samuel Takele Kenea, Haeyoung Lee, Prabir K. Patra, Shanlan Li, Lev D. Labzovskii, Sangwon Joo | Journal: Atmospheric Environment | Year: 2023 | doi: https://doi.org/10.1016/j.atmosenv.2022.119437

    Publication

  4. Aerosol Retrieval and Assimilation (ARIA) - final report

    Climate assessments are hampered by the large uncertainties involved in the estimation of the eff...

    GHL Verver, JS Henzing, PFJ van Velthoven, C Robles-Gonzales (TNO-FEL), G de Leeuw (TNO-FEL) | Year: 2002 | Pages: 35

    Publication

  5. HIGH-RESOLUTION ASCAT SCATTEROMETER WINDS NEAR THE COAST

    KNMI is involved in the Level 2 scatterometer wind processing of the EUMETSAT Ocean and Sea Ice S...

    A Stoffelen, M Portabella, A Verhoef, J Verspeek, J Vogelzang | Conference: International Geoscience and Remote Sensing Symposium (IGARSS) | Organisation: IEEE | Place: Boston, USA | Year: 2008 | First page: 0 | Last page: 0

    Publication